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x ray diffraction xrd patterns  (Bruker Corporation)


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    Bruker Corporation x ray diffraction xrd patterns
    <t>X-ray</t> <t>diffraction</t> <t>(XRD)</t> spectra (A) , and Thermal properties (B) of RPSPI after MN, US, and combined treatments.
    X Ray Diffraction Xrd Patterns, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 26583 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/d8+discover/D8+DISCOVER/pmc13000716-98-3-14
    Average 99 stars, based on 26583 article reviews
    x ray diffraction xrd patterns - by Bioz Stars, 2026-09
    99/100 stars

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    1) Product Images from "Sonication integrated with micronization: structural modification to improve the in-vitro digestibility, functional, and antioxidant properties of red pepper seed protein isolate"

    Article Title: Sonication integrated with micronization: structural modification to improve the in-vitro digestibility, functional, and antioxidant properties of red pepper seed protein isolate

    Journal: Ultrasonics Sonochemistry

    doi: 10.1016/j.ultsonch.2026.107816

    X-ray diffraction (XRD) spectra (A) , and Thermal properties (B) of RPSPI after MN, US, and combined treatments.
    Figure Legend Snippet: X-ray diffraction (XRD) spectra (A) , and Thermal properties (B) of RPSPI after MN, US, and combined treatments.

    Techniques Used:

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    Article Title: Resin composition, film, and multilayer structure
    Article Snippet: .. The wide angle X-ray diffraction is performed under the following conditions: [Measurement Conditions] Apparatus: D8 DISCOVER (available from Bruker Japan Co., Ltd.) Detector: Two-dimensional detector VANTEC-500 (available from Bruker Japan Co., Ltd.) Voltage: 50 kV Electric current: 100 mA Camera length: 100 mm Measurement method: Reflection method Integration period: 30 minutes Wavelength: CuKα radiation (with Kα1 and Kα2 not separated) Detector position: 2θ=10° X-ray incident angle: θ=0.3° Conditions for one-dimensional integration in 2θ direction: 2θ=0 to 35°, Azimuthal angle (chi)=−95 to −85° One-dimensional integration in azimuthal direction: Azimuthal angle (chi)=−180 to 0° The one-dimensional integration in the azimuthal direction is performed with a 1.0° range, so that a peak having the highest diffraction intensity appears at 2θ=2 to 15°. ..

    Article Title: Cathode electrode, composite of cathode electrode and substrate, and method of manufacturing composite of cathode electrode and substrate
    Article Snippet: .. When the cathode electrode is a thin film, used for the X-ray diffraction is a measurement method suitable for measuring a thin film, for example, using “D8 DISCOVER with VANTEC2000”, an X-ray microdiffraction apparatus manufactured by Bruker AXS. ..

    Article Title: Resin composition, film, and multilayer structure
    Article Snippet: .. The sample was analyzed by performing the wide angle X-ray diffraction measurement under the following conditions: [Measurement Conditions] Apparatus: D8 DISCOVER (available from Bruker Japan Co., Ltd.) Detector: Two-dimensional detector VANTEC-500 (available from Bruker Japan Co., Ltd.) Voltage: 50 kV Electric current: 100 mA Camera length: 100 mm Measurement method: Reflection method Integration period: 30 minutes Wavelength: CuKα radiation (with Kα1 and Kα2 not separated) Detector position: 2θ=10° X-ray incident angle: θ=0.3° Conditions for one-dimensional integration in 2θ direction: 2θ=0 to 35°, Azimuthal angle (chi)=−95 to −85° One-dimensional integration in azimuthal direction: 2θ=6.0 to 7.0°, Azimuthal angle (chi)=−180 to 0° After the X-ray diffraction measurement, the resulting diffraction pattern in an azimuthal angle range of −180 to 0° was azimuthally integrated into a one-dimensional diffraction pattern in a range of 2θ=6.0 to 7.0° for confirmation of the azimuthal dependence of the diffraction intensity. ..

    Article Title: Cathode electrode, composite of cathode electrode and substrate, and method of manufacturing composite of cathode electrode and substrate
    Article Snippet: .. The X-ray diffraction was measured by using “D8 DISCOVER with VENTEC2000”, an X-ray microdiffraction apparatus manufactured by Bruker AXS. .. The molar ratio of Cu/Cu2O was determined by measuring a Cu-LMM peaks (Augur electron peaks) and peak separation using “PHI Quantes”, XPS (X-ray photoelectron spectroscopy) apparatus manufactured by ULVAC-PHI, Inc. (the measurement radiation source was AlKα ray (hv=1486.6 eV), a take-off angle was 90 degree).

    Produced:

    Article Title: Electrophotographic photoreceptor, process cartridge, and image forming apparatus
    Article Snippet: .. Measurement instrument: D8 DISCOVER produced by Bruker AXS X-ray source: Cukα Measurement method: 2θ/θ scan Alternatively, Cr, Fe, Co, or Mo may be used as the X-ray source, and the measurement range is set within the range with which all diffraction peaks of the electron transport compound in a powdered state can be detected. ..



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    Image Search Results


    X-ray diffraction (XRD) spectra (A) , and Thermal properties (B) of RPSPI after MN, US, and combined treatments.

    Journal: Ultrasonics Sonochemistry

    Article Title: Sonication integrated with micronization: structural modification to improve the in-vitro digestibility, functional, and antioxidant properties of red pepper seed protein isolate

    doi: 10.1016/j.ultsonch.2026.107816

    Figure Lengend Snippet: X-ray diffraction (XRD) spectra (A) , and Thermal properties (B) of RPSPI after MN, US, and combined treatments.

    Article Snippet: The RPSPI sample’s X-ray diffraction (XRD) patterns were measured using a D8 DISCOVER diffractometer (Bruker, AXS, Germany) with Cu Kα radiation (λ = 1.5406 Å).

    Techniques: